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Harmonized Tariff Schedule of the United States  
Enter either the first part of an HTS category number up to 8 digits or any part of a product description.    
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Harmonized Tariff Schedule
HTS NoStat Suffix Description Unit of Quantity Rates of Duty
1 2
General Special
7017.10.3000Quartz reactor tubes and holders designed for insertion into diffusion and oxidation furnaces for production of semiconductor wafersXFree50%
7020.00.3000Quartz reactor tubes and holders designed for insertion into diffusion and oxidation furnaces for production of semiconductor wafersXFree55%
8480.71.4000For the manufacture of semiconductor devicesNo.FreeFree
8486Machines and apparatus of a kind used solely or principally for the manufacture of semiconductor boules or wafers, semiconductor devices, electronic integrated circuits or flat panel displays; machines and apparatus specified in Note 9 (C) to this chapter; parts and accessories:
8486.20.0000Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits:No.Free35%
8486.40.0020For assembling semiconductor devices or electronic integrated circuitsNo.
8486.40.0030For lifting, handling, loading or unloading of boules, wafers, semiconductor devices, electronic integrated circuits and flat panel displaysNo.
8519.81Using magnetic, optical or semiconductor media:
8523.51.0000Semiconductor media:
8541Diodes, transistors and similar semiconductor devices; photosensitive semiconductor devices, including photovoltaic cells whether or not assembled in modules or made up into panels; light-emitting diodes; mounted piezoelectric crystals; parts thereof:
8541.40Photosensitive semiconductor devices, including photovoltaic cells whether or not assembled in modules or made up into panels; light-emitting diodes:
8541.50.00Other semiconductor devicesFree35%
9030.82.0000For measuring or checking semiconductor wafers or devicesNo.Free40%
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.41.0040For inspecting semiconductor wafers or devices:
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.80.4000Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesNo.Free40%
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