| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.80.80 | | Other | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9031.80.80 | 60 | Equipment for testing the characteristics of internal combustion engines: | | | | |
| 9031.80.80 | 60 | For testing electrical characteristics | X | | | |
| 9031.80.80 | 70 | Other | X | | | |
| 9031.80.80 | 85 | Other | X | | | |
| 9031.90.45 | 00 | Of other optical instruments and appliances, other than test benches: | | | | |
| 9031.90.45 | 00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | X | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.90.54 | 00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | X | Free | | 50% |
| 9031.90.58 | 00 | Other | X | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.90.70 | 00 | Other: | | | | |
| 9031.90.70 | 00 | Of articles of subheading 9031.80.40 | X | Free | | 40% |
| 9031.90.90 | | Other | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9031.90.90 | 30 | Of machines for balancing mechanical parts | X | | | |
| 9031.90.90 | 60 | Of test benches | X | | | |
| 9031.90.90 | 95 | Other | X | | | |
| 9032 | | Automatic regulating or controlling instruments and apparatus; parts and accessories thereof: | | | | |
| 9032.10.00 | | Thermostats | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9032.10.00 | 30 | For air conditioning, refrigeration or heating systems: | | | | |
| 9032.10.00 | 60 | Other | No. | | | |
| 9032.10.00 | 90 | Other | No. | | | |
| 9032.81.00 | | Other instruments and apparatus: | | | | |
| 9032.81.00 | | Hydraulic and pneumatic | | 1.6% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 35% |
| 9032.81.00 | 20 | Hydraulic | No. | | | |
| 9032.81.00 | 80 | Other | No. | | | |
