| 9027.30 | | Spectrometers, spectrophotometers and spectrographs using optical radiations (ultraviolet, visible, infrared): | | | | |
| 9027.30.40 | | Electrical | | Free | | 40% |
| 9027.30.40 | 40 | Spectrophotometers | No. | | | |
| 9027.30.80 | 20 | Spectroscopes | No. | | | |
| 9027.50.40 | | Electrical | | Free | | 40% |
| 9027.80.45 | | Electrical | | Free | | 40% |
| 9027.80.45 | 20 | Mass spectrometers | No. | | | |
| 9027.90.45 | 00 | Of electrical instruments and apparatus: | | | | |
| 9028 | | Gas, liquid or electricity supply or production meters, including calibrating meters thereof; parts and accessories thereof: | | | | |
| 9028.30.00 | 00 | Electricity meters | No. | 16¡é/each + 1.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | $4.50 each + 65% |
| 9028.90.00 | 40 | Of electricity meters | X | | | |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.10 | 00 | Profile projectors | X | 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.80.80 | 60 | For testing electrical characteristics | X | | | |
| 9031.90.20 | 00 | Of profile projectors | X | 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9101.11 | | Wrist watches, electrically operated, whether or not incorporating a stop watch facility: | | | | |
| 9101.19.20 | | With opto-electronic display only. | | Free | | 35% |
| 9101.91 | | Electrically operated: | | | | |
