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9030.33.00Other, without a recording device1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.33.0080OtherX
9030.39.0100Other, with a recording deviceX1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.40.0000Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers)XFree40%
9030.82.0000Other instruments and apparatus:
9030.84.0000Other, with a recording deviceX1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.89.0100OtherX1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.90.4500OtherX1.6%Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG)40%
9030.90.6400Other:
9030.90.6800OtherX1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.90.8400Other:
9030.90.88Other1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.90.8861OtherX
9031.41.00Other optical instruments and appliances:
9031.41.0060OtherNo.
9031.49Other:
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.49.9000OtherX3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.80Other instruments, appliances and machines:
9031.80.80Other1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9031.80.8070OtherX
9031.80.8085OtherX
9031.90.4500Of other optical instruments and appliances, other than test benches:
9031.90.5800OtherX3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.90.7000Other:

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