| 8486.40.00 | 10 | For the manufacture or repair of masks and reticles | No. | | | |
| 8537 | | Boards, panels, consoles, desks, cabinets and other bases, equipped with two or more apparatus of heading 8535 or 8536, for electric control or the distribution of electricity, including those incorporating instruments or apparatus of chapter 90, and numerical control apparatus, other than switching apparatus of heading 8517: | | | | |
| 8538.10.00 | 00 | Boards, panels, consoles, desks, cabinets and other bases for the goods of heading 8537, not equipped with their apparatus | X | 3.7% | Free (A,AU,B,BH, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 35% |
| 9020.00 | | Other breathing appliances and gas masks, excluding protective masks having neither mechanical parts nor replaceable filters; parts and accessories thereof: | | | | |
| 9020.00.60 | 00 | Other breathing appliances and gas masks | X | 2.5% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 35% |
| 9022 | | Apparatus based on the use of X-rays or of alpha, beta or gamma radiations, whether or not for medical, surgical, dental or veterinary uses, including radiography or radiotherapy apparatus, X-ray tubes and other X-ray generators, high tension generators, control panels and desks, screens, examination or treatment tables, chairs and the like; parts and accessories thereof: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9617.00 | | Vacuum flasks and other vacuum vessels, complete with cases; parts thereof other than glass inners: | | | | |
