| 9029.20.40 | | Other speedometers and tachometers | | Free | | 35% |
| 9029.20.60 | 00 | Stroboscopes | No. | 16￠/each + 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | $4.50 each + 65% |
| 9029.90.20 | 00 | Of taximeters | X | 5.3% | Free (A,AU,B,BH, CA,CL,E,IL,J, JO,MA,MX,P, SG) | 85% |
| 9029.90.40 | 00 | Of bicycle speedometers | X | 6% | Free (A+,AU,BH, CA,CL,D,E,IL,J, JO,MA,MX,P, SG) | 110% |
| 9029.90.60 | 00 | Of stroboscopes | X | 3.2% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 65% |
| 9029.90.80 | 40 | Of speedometers and tachometers | X | | | |
| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.20.05 | 00 | Specially designed for telecommunications | No. | Free | | 40% |
| 9030.20.10 | 00 | Other oscilloscopes and oscillographs | No. | 1.7% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.90.25 | 00 | Printed circuit assemblies | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031.10.00 | 00 | Machines for balancing mechanical parts | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031.20.00 | 00 | Test benches | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For wafers | No. | | | |
| 9031.49.10 | 00 | Profile projectors | X | 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9031.49.40 | 00 | Coordinate-measuring machines | No. | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.80.80 | 60 | For testing electrical characteristics | X | | | |
| 9031.90.20 | 00 | Of profile projectors | X | 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9031.90.90 | 30 | Of machines for balancing mechanical parts | X | | | |
| 9031.90.90 | 60 | Of test benches | X | | | |
| 9032.10.00 | | Thermostats | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
