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9031.20.0000Test benchesX1.7%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)45%
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.41.0040For wafersNo.
9031.49.1000Profile projectorsX2.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)45%
9031.49.4000Coordinate-measuring machinesNo.3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.80.4000Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesNo.Free40%
9031.80.8060For testing electrical characteristicsX
9031.90.2000Of profile projectorsX2.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)45%
9031.90.9030Of machines for balancing mechanical partsX
9031.90.9060Of test benchesX
9032.10.00Thermostats1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9032.20.0000ManostatsNo.1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)35%
9032.89.6015Complete systemsNo.
9032.89.6030Complete systemsNo.
9032.89.6040Temperature control instrumentsNo.
9032.89.6050Pressure and draft control instrumentsNo.
9032.89.6060Flow and liquid level control instrumentsNo.
9032.89.6070Humidity control instrumentsNo.
9032.90.6020Of thermostatsX
9032.90.6040Of manostatsX
9101.11.4010MovementNo.
9101.11.4030Strap, band or braceletNo.
9101.11.40Having no jewels or only one jewel in the movement51¡é/each + 6.25% on the case and strap, band or bracelet + 5.3% on the batteryFree (AU,BH,CA, CL,D,E,IL,J, J+,JO,MA,MX, P,R,SG)$2.25 each + 45% on the case +80% on the strap, band or bracelet + 35% on the battery

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