| 9019.10.20 | 10 | Mechano-therapy appliances | No. | | | |
| 9019.10.20 | 90 | Parts and accessories | X | | | |
| 9021.10.00 | 50 | Bone plates, screws and nails, and other internal fixation devices or appliances | X | | | |
| 9021.90.40 | | Parts and accessories for hearing aids and for pacemakers for stimulating heart muscles | | Free | | 35% |
| 9022.13.00 | 00 | Other, for dental uses | X | Free | | 35% |
| 9022.14.00 | 00 | Other, for medical, surgical or veterinary uses | X | Free | | 35% |
| 9022.19.00 | 00 | For other uses | X | Free | | 35% |
| 9022.21.00 | 00 | For medical, surgical, dental or veterinary uses | X | Free | | 35% |
| 9022.30.00 | 00 | X-ray tubes | No. | 0.9% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 35% |
| 9022.90.40 | 00 | Of X-ray tubes | X | 0.9% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 35% |
| 9024.80.00 | 00 | Other machines and appliances | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9024.90.00 | | Parts and accessories | | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9025.90.00 | 00 | Parts and accessories | X | The rate applicable to the article of which it is a part or accessory | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | The rate applicable to the article of which it is a part or accessory |
| 9027.30.80 | 20 | Spectroscopes | No. | | | |
| 9027.90.20 | 00 | Microtomes | No. | 2.2% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9028.90.00 | | Parts and accessories | | 3.2% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 65% |
| 9029.20.60 | 00 | Stroboscopes | No. | 16￠/each + 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | $4.50 each + 65% |
| 9029.90.60 | 00 | Of stroboscopes | X | 3.2% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 65% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.90.25 | 00 | Printed circuit assemblies | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031.20.00 | 00 | Test benches | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.49.40 | 00 | Coordinate-measuring machines | No. | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
