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Harmonized Tariff Schedule of the United States  
Enter either the first part of an HTS category number up to 8 digits or any part of a product description.    
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Harmonized Tariff Schedule
HTS NoStat Suffix Description Unit of Quantity Rates of Duty
1 2
General Special
9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
9031.10.0000Machines for balancing mechanical partsX1.7%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)40%
9031.20.0000Test benchesX1.7%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)45%
9031.41.00Other optical instruments and appliances:
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.41.0040For inspecting semiconductor wafers or devices:
9031.41.0040For wafersNo.
9031.41.0060OtherNo.
9031.49Other:
9031.49.1000Profile projectorsX2.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)45%
9031.49.4000Coordinate-measuring machinesNo.3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.49.9000OtherX3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.80Other instruments, appliances and machines:
9031.80.4000Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesNo.Free40%
9031.80.80Other1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9031.80.8060Equipment for testing the characteristics of internal combustion engines:
9031.80.8060For testing electrical characteristicsX
9031.80.8070OtherX
9031.80.8085OtherX
9031.90Parts and accessories:
9031.90.2000Of profile projectorsX2.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)45%
9031.90.4500Of other optical instruments and appliances, other than test benches:
9031.90.4500Bases and frames for the coordinate-measuring machines of subheading 9031.49.40X3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
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