| 9027.90.45 | 00 | Parts and accessories: | | | | |
| 9027.90.54 | 25 | Of articles of subheading 9027.20.50 | X | | | |
| 9027.90.54 | 30 | Of articles of subheading 9027.30.40 | X | | | |
| 9027.90.54 | 40 | Of articles of subheading 9027.50.10 | X | | | |
| 9027.90.54 | 50 | Of articles of subheading 9027.50.40 | X | | | |
| 9027.90.58 | 10 | Of articles of subheading 9027.10.20 | X | | | |
| 9028 | | Gas, liquid or electricity supply or production meters, including calibrating meters thereof; parts and accessories thereof: | | | | |
| 9028.90.00 | | Parts and accessories | | 3.2% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 65% |
| 9029 | | Revolution counters, production counters, taximeters, odometers, pedometers and the like; speedometers and tachometers, other than those of heading 9014 or 9015; stroboscopes; parts and accessories thereof: | | | | |
| 9029.90 | | Parts and accessories: | | | | |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.90 | | Parts and accessories: | | | | |
| 9030.90.25 | 00 | For articles of subheading 9030.10: | | | | |
| 9030.90.88 | 11 | Of articles of subheading 9030.20 | X | | | |
| 9030.90.88 | 21 | Of articles of subheading 9030.31 | X | | | |
| 9030.90.88 | 22 | Of articles of subheading 9030.32 | X | | | |
| 9030.90.88 | 23 | Of articles of subheading 9030.33 | X | | | |
| 9030.90.88 | 31 | Of articles of subheading 9030.39 | X | | | |
| 9030.90.88 | 40 | Of articles of subheading 9030.40 | X | | | |
| 9030.90.88 | 56 | Of articles of subheading 9030.84 | X | | | |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.10.00 | 00 | Machines for balancing mechanical parts | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.90 | | Parts and accessories: | | | | |
| 9031.90.70 | 00 | Of articles of subheading 9031.80.40 | X | Free | | 40% |
Harmonized Tariff Schedule of the United States inquiry: 39ÃÂÃÂÃÂÃÂÃÂÃÂÃÂãÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂ=
