| 9027.80.45 | 20 | Mass spectrometers | No. | | | |
| 9027.90.45 | 00 | Printed circuit assemblies for the goods of subheading 9027.80 | X | Free | | 40% |
| 9028 | | Gas, liquid or electricity supply or production meters, including calibrating meters thereof; parts and accessories thereof: | | | | |
| 9028.10.00 | 00 | Gas meters | No. | 16¢/each + 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | $4.50 each + 65% |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.31.00 | 00 | Other instruments and apparatus, for measuring or checking voltage, current, resistance or power: | | | | |
| 9030.33.00 | 40 | For measuring or checking voltage, current or resistance | X | | | |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.90.25 | 00 | Printed circuit assemblies | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.90.64 | 00 | Printed circuit assemblies: | | | | |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.49.40 | 00 | Coordinate-measuring machines | No. | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.90.45 | 00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | X | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9101 | | Wrist watches, pocket watches and other watches, including stop watches, with case of precious metal or of metal clad with precious metal: | | | | |
| 9101.11.40 | 20 | Case | No. | | | |
| 9101.11.80 | 20 | Case | No. | | | |
| 9101.19.20 | 20 | Straps, bands or bracelets entered with watches of subheading 9101.19.20 and classifiable therewith pursuant to additional U.S. note 2 to this chapter; all the foregoing whether or not attached to such watches at the time of entry: | | | | |
| 9101.19.20 | 20 | Of textile material or of base metal, whether or not gold- or silver-plated | No | | | |
| 9101.19.40 | 20 | Case | No. | | | |
| 9101.21.10 | 00 | Of textile material or of base metal, whether or not gold- or silver-plated | No. | 3.1% | Free (AU,BH,CA, CL,D,E,IL,J,J+, JO,MA,MX, P,R,SG) | 80% |
Harmonized Tariff Schedule of the United States inquiry: 39ÃÂÃÂÃÂÃÂÃÂÃÂÃÂãÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂÃÂ=
